POWER DEVICE ANALYSIS

Wednesday 11:00 AM - Mission Towers - Room D

Program Description :

GaN and SiC device characterization as it relates to switch mode power supplies. Use an oscilloscope to probe MOSFET terminal voltages and drain current to easily measure conduction and switching losses.

TELEDYNE LECROY
Farooq Yousuf
farooq.yousuf@teledyne.com

SpeakerCredentials
Field Applications Engineer

Speakers LinkedinPage
Linked IN Page


Del Mar Electronics & Manufacturing Show Sponsors
                   
DMEMS - Contact
  • Contact / Email
  • Wednesday
    April 22nd, 2026
  • Thursday
    April 23rd, 2026
  • Trade Show
  • Conference
  • 2260 Jimmy Durante Blvd.
  • Del Mar CA 92014
  • 858-459-1682